作者：YonghuaRong
页数：552
出版社：高等教育出版社
出版日期：2012
ISBN：9787040300925
电子书格式：pdf/epub/txt
内容简介
本收系统地介绍了分析电子显微学（aem）的基本概念和操作技术，聚集于相恋和形变中位错的aem研究。同时通过大量的例子阐述衍射晶体学的物理概念和数学分析方法，例如相变中位向关系的定量预测等，以便读者加深理解和拓展视野。
目录
chapter 1 analytical electron microscope (aem)
1.1 brief introduction of aem history
1.2 interaction between electrons and specimen and signals used by
aem
1.3 electron wavelength and electromagnetic lens
1.3.1 electron wavelength
1.3.2 electromagnetic lens
1.4 structure and function of aem
1.4.1 illumination system
1.4.2 specimen holders
1.4.3 imaging system
1.4.4 image recording
1.4.5 power supply system and vacuum system
1.4.6 computer control ’
1.5 the principle of imaging, magnifying and diffracting
1.6 theoretical resolution limit
1.1 brief introduction of aem history
1.2 interaction between electrons and specimen and signals used by
aem
1.3 electron wavelength and electromagnetic lens
1.3.1 electron wavelength
1.3.2 electromagnetic lens
1.4 structure and function of aem
1.4.1 illumination system
1.4.2 specimen holders
1.4.3 imaging system
1.4.4 image recording
1.4.5 power supply system and vacuum system
1.4.6 computer control ’
1.5 the principle of imaging, magnifying and diffracting
1.6 theoretical resolution limit
